【产品详情】
The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.
Sub 100 nm topographic and thermal spatial resolution is readily achieved, with a temperature resolution of 0.1 K.
KNT have been fabricating scanning thermal microscopy probes used by industry and academia for over fifteen years. The KNT-SThM-2an delivers improved mechanical stability and operation over an extended temperature range.
KNT-STHM Specifications | |
Max Frequency (kHz): | 205 |
Spring Constant (N/m): | 0.4 |
Max Spring Constant (N/m): | 0.4 |
Tip Radius (nm): | 10 |
Tip Height (um): | 12.5 |
Max Tip Height (um): | 10 |
Tip Shape: | Customer |
Tip Coating: | 5nm of NiCr and 40nm Pd |
Manufacturer: | Kelvin Nanotechnology |