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AFM探针 KNT-STHM 5根/盒

销售价
¥ 17500 .00
货品编号:KNT-STHM
品牌:Kelvin Nanotechnology
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【产品详情】

The KNT (Kelvin Nanotechnology) scanning thermal microscopy probe is a batch fabricated AFM probe for best in class simultaneous topography and temperature/thermal conductivity mapping. The probe offers excellent flexibility and with a low spring constant Si3N4 cantilever for easy scanning and high resolution.

Sub 100 nm topographic and thermal spatial resolution is readily achieved, with a temperature resolution of 0.1 K.

KNT have been fabricating scanning thermal microscopy probes used by industry and academia for over fifteen years. The KNT-SThM-2an delivers improved mechanical stability and operation over an extended temperature range.


KNT-STHM Specifications

Max Frequency (kHz):

205

Spring Constant (N/m):

0.4

Max Spring Constant (N/m):

0.4

Tip Radius (nm):

10

Tip Height (um):

12.5

Max Tip Height (um):

10

Tip Shape:

Customer

Tip Coating:

5nm of NiCr and 40nm Pd

Manufacturer:

Kelvin Nanotechnology